Tender Details
Beyond this tender, use our platform to source any product, service, or solution.
Get direct quotes or register as a qualified provider.
| Particulars | Details |
|---|---|
| Title |
Dual Beam Electron Microscope
|
| Description |
Dual Beam Electron Microscope
|
| Organisation | Indian Institute of Technology Madras | Public Sector Undertakings |
| Tender Id | 2024_IITM_187891_1 |
|
Reference Number |
GTE01/PRAD/2024/17/DBELECTMIC |
| Tender Fee | 0 |
| EMD | 13 Lakh |
| Tender Value | |
| Place | Department of Metallurgical and Materials Engineer |
| Link |
View Original Tender Notice
https://etenders.gov.in/eprocure/app?page=FrontEndTenderDetailsExternal&service=page&tnid=205591 |
| Start Date | February 24, 2024 14:30 |
| End Date |
Expired
25/03/2024
Expired 808 days ago |
Tender Support
Get help with filing, GeM registration, documents, or relevant tender alerts.
Procurement of dual energy x ray absorptiometry (dexa) 01 nos. for jpnatc
Procurement of dual energy x ray absorptiometry (dexa) 01 nos. for jpnatc
Read moreDual beam focused ion beam - field emission gun scanning electron microscope
Dual beam focused ion beam - field emission gun
 scanning electron microscope
Read moreDual beam focused ion beam - field emission gun scanning electron microscope
Dual beam focused ion beam - field emission gun
 scanning electron microscope
Read moreof your Industry type