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| Particulars | Details |
|---|---|
| Title |
Dual Beam Focused Ion Beam Field Emission Gun Scanning Electron Microscope
|
| Description |
Dual Beam Focused Ion Beam Field Emission Gun
Scanning Electron Microscope
|
| Organisation | Indian Institute of Technology Roorkee | Central Govt. Ministry/Department |
| Tender Id | 2024_IITR_822432_1 |
|
Reference Number |
2024250209/MM-24/MMED/216 |
| Tender Fee | 0 |
| EMD | 16 Lakh |
| Tender Value | |
| Place | IIT Roorkee |
| Link | https://eprocure.gov.in/eprocure/app?page=FrontEndTenderDetailsExternal&service=page&tnid=864288 |
| Start Date | August 29, 2024 20:30 |
| End Date |
12/09/2024 ( Expired 280 days ago ) Search Similar tenders? |
|
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