Results for: Indian Institute of Technology Madras
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Mgo doped x-cut lithium niobate on insulator wafer ssp
Mgo doped x-cut lithium niobate on insulator wafer ssp
🔋 Invitation for Bid: MGO Doped X-Cut Lithium Niobate on Insulator (LNOI) Wafer SSP 🔋 The Indian Institute of Technology Madras, under the aegis of the Central Government's Ministry/Department, is seeking bids for the supply of MGO Doped X-Cut Lithium Niobate on Insulator (LNOI) Wafers under the Strategic Electronics Components Initiative (SECI). 📅 Bid Submission Deadline: July 10, 2024, 3:00 PM A tender fee of INR 15,000/- is applicable for the bid submission. Interested bidders must submit their Earnest Money Deposit (EMD) along with the bid documents. The procurement is aimed at fostering innovation and advancing research in the field of materials science and electronics. Bidders are expected to meet stringent quality standards and provide detailed specifications, pricing, and delivery schedules. Keywords: MGO Doped X-Cut Lithium Niobate, LNOI Wafer, SSP, SECI, IIT Madras, Government Tender, Electronics Components, Research Materials
Power analyzer 4 channel with current probes
Power analyzer 4 channel with current probes
⚡️Electrical Engineers & Specialists Take Note!⚡️ The Indian Institute of Technology Madras, under the Central Government's Ministry/Department, is calling for bids to supply a Power Analyzer with 4 Channels and Current Probes. 🔧📊 Bid Submission Deadline: June 27, 2024, 3:00 PM EMD: INR 38000 Interested suppliers must provide detailed technical specifications, pricing, and delivery schedules for this specialized equipment. This procurement is aimed at enhancing research and development capabilities within the Department of Engineering Design. Keywords: Power Analyzer, Current Probes, Electrical Equipment, IIT Madras, Engineering Design, Government Tender, Bid Submission
High performance elemental analyzer for simultaneous chns analysis
High performance elemental analyzer for simultaneous chns analysis
Ctd-odo sensor
Ctd-odo sensor
3d xray based microscopy for internal defect assessment and quantification
3d xray based microscopy for internal defect assessment and quantification
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